Steam aging test box

Aging accelerated life time test before the tin-dip test of electronic connector, semiconductor IC, transistor, diode, liquid crystal LCD, chip resistor and capacitor, and component industry; Oxidation test for semiconductor, passive component and component pin.

Microcomputer temperature controller, LED digital display, PID+SSR control, platinum resistance temperature sensor (pt-100), resolution 0.1℃, automatic safety protection device.

Technical specifications:

Internal size: 500×400×170(W×H×D)mm;

External size :600×500×420(W×H×D)mm;

Internal and external cabinet material: SUS304# high quality stainless steel plate;

Insulation layer: PV foam

Heating time: about 40 minutes; Control function :PID+SSR, digital display;

Steam temperature: 97℃;

Timing function: 1 ~ 9999H/M/S, with alarm function, cut off the power when the time arrives;

Water level control: low water level alarm function;

Power supply: 1? 220 v + 10% for 50 hz 1.0 KW

Meet: GB2423.17; GB/ t5170.8-96, iec 68-2.1 and ISO standards